onsemi offers Application Specific Integrated Circuit (ASIC) solutions critical for aerospace applications and products requiring rigorous FIT rates due to terrestrial radiation exposure. A combination of characterization test data, soft-error-aware design flow methodology, qualification, and handling flows allow customers multiple options in planning and designing ASICs in a wide variety of applications. Available in the company’s 110 nm and 180 nm digital processes, the standard cell and SRAM architectures achieved superior neutron test results across voltage and temperature. To further reduce Single Event Effects (SEE), the design offering includes enhanced substrates, redundancy, and error correction code (ECC) options. Leveraging the company’s existing commercial digital ASIC flow, customers benefit from superior pricing, development spans, and manufacturing cycle times.

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