Blog Author

Catherine De Keukeleire

Catherine graduated from the Université de Bourgogne – Dijon, France. She received her master’s degree in Applied Physics & Electronics in 1992 and her Ph.D. in Solid State Physics & Microelectronics in 1996. She moved to Belgium right after her Ph.D., accepting a position as a Reliability Engineer at Alcatel Microelectronics, later acquired by AMI Semiconductor and then onsemi. Her primary focus was on electromigration degradation and hot carrier performance of DMOS transistors in BCD technologies. While still driven by technical expertise and strong academic knowledge, she rapidly grew into leadership, first managing a small group of Reliability Engineers working on validating manufacturing processes and qualification of Silicon technologies. In 2006, she extended her responsibilities to the qualification of ASIC and ASSP products for the Automotive market, including management of the local Reliability Laboratory. A few years back, she added the reliability of GaN and SiC technologies to her fields of interest. Since 2021, she has led the Intrinsic Wide band gap and Power Module Reliability organization at onsemi.

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