NCP170AMX330GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board
The NCP170AMX330GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications. |
Evaluation/Development Tool Information
| Product | Status | Compliance | Short Description | Parts Used | Action | |
|---|---|---|---|---|---|---|
| NCP170AMX330GEVB | Active |
|
Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board | NCP170BMX330TCG |
Technical Documents
| Type | Document Title | Document ID/Size | Rev |
| Eval Board: BOM | NCP170AMX330GEVB Bill of Materials ROHS Compliant | NCP170AMX330GEVB_BOM_ROHS.pdf - 15 KB | 0 |
| Eval Board: Gerber | NCP170AMX330GEVB Gerber Layout Files (Zip Format) | NCP170AMX330GEVB_GERBER.zip - 37 KB | 0 |
| Eval Board: Schematic | NCP170AMX330GEVB Schematic | NCP170AMX330GEVB_SCHEMATIC.pdf - 50 KB | 0 |
| Eval Board: Test Procedure | NCP170AMX330GEVB Test Procedure | NCP170AMX330GEVB_TEST_PROCEDURE.pdf - 36 KB | 0 |
| Video | Ultra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170 | WVD17574/D |
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