Logic Gates | NLSF308

Quad 2-Input AND Gate

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Overview

The NLSF308 is an advanced high speed CMOS 2-Input AND gate fabricated with silicon gate CMOS technology. It achieves high speed operation similar to equivalent Bipolar Schottky TTL while maintaining CMOS low power dissipation.

The internal circuit is composed of three stages, including a buffer output which provides high noise immunity and stable output. The inputs tolerate voltages up to 7V, allowing the interface of 5V systems to 3V systems.

  • Cell Phones

  • High Speed: tPD = 4.3ns (Typ) at VCC = 5V
  • Low Power Dissipation: ICC = 2?A (Max) at TA = 25 C
  • High Noise Immunity: VNIH = VNIL = 28% VCC
  • Power Down Protection Provided on Inputs
  • Balanced Propagation Delays
  • Designed for 2V to 5.5V Operating Range
  • Low Noise: VOLP = 0.8V (Max)
  • Function Compatible with Other Standard Logic Families
  • QFN-16 Package
  • Latchup Performance Exceeds 300mA
  • ESD Performance: HBM > 2000V; Machine Model > 200V
  • Chip Complexity: 24 FETs or 6 Equivalent Gates
  • Pb-Free Package is Available

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NLSF308MNR2G

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Last Shipments

CAD Model

Pb

A

H

P

QFN-16

485G-01

1

260

REEL

3000

N

AND

4

2

5.5

null

null

Price N/A

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Reliability Data

Die Related Summary Data

Device: NLSF308MNR2G

Equivalent to wafer fab process: CMOS SUB

Product Technology

Product Technology

Equivalent Device-Hours

MTBF/MTTF in Hours

FITS

CMOS SUB

2

920154574

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Re-calculate Data

Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

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