EEPROM Memory | NV24C32MUW

EEPROM Serial 32-Kb I2C - Automotive Grade

Active

Datasheet

Products

Overview

The NV24C32MUW is a EEPROM Serial 32-Kb I2C - Automotive Grade devices, internally organized as 4096 words of 8 bits each in a small-footprint Wettable Flank UDNF-8 package.

It features a 32-byte page write buffer and supports the Standard (100 kHz) and Fast (400 kHz) I2C protocol.

External address pins make it possible to address up to eight NV24C32WF devices on the same bus.

  • Door module
  • Seat control unit
  • Wiper module
  • Immobilizer unit
  • Fan control unit
  • Park assist unit
  • Light management unit
  • Electronic parking brake
  • Engine Start/Stop control unit
  • Engine control unit
  • ABS/ESP (Electronic Stability Program)
  • Airbag
  • Integrated navigation and infotainment systems
  • Electric steering control unit, ESL
  • Body computer & energy management unit

  • Motor Vehicles

  • Automotive Temperature Grade 1 (-40°C to +125°C)
  • This Device is Pb-Free, Halogen Free/BFR Free, and RoHS Compliant
  • Wettable Flank UDFN Package Supports Auto-Optical Inspection
  • 2.5V to 5.5 V Supply Voltage Range
  • Supports Standard and Fast I2C Protocol
  • 32-Byte Page Write Buffer
  • Hardware Write Protection for Entire Memory
  • NV Prefix for Automotive and Other Applications Requiring Site and Change Control
  • Schmitt Triggers and Noise Suppression Filters on I2C Bus Inputs(SCL and SDA)
  • Low Power CMOS Technology
  • 100 Year Data Retention
  • 1,000,000 Program/Erase Cycles

Tools and Resources

Product services, tools and other useful resources related to NV24C32MUW

CAD Model

CAD Model

Material Composition

Product Change Notification

Reliability Data

Product List

If you wish to buy products or product samples, please log in to your onsemi account.

Search

Close Search

Products:

1

Share

Sort by

Product Groups:

┗

Orderable Parts:

1

Product

Status

CAD Models

Compliance

Package Type

Case Outline

MSL Type

MSL Temp (°C)

Container Type

Container Qty.

ON Target

Type

Density

Organization

Data Transmission Standard

fcycle Max (kHz)

tACC Max ns

VCC Min (V)

VCC Max (V)

Vio Ref (V)

Istandby Max (µA)

Iact Max (mA)

T Min (°C)

T Max (°C)

Endurance (Write cycles)

Specific Features

Reference Price

NV24C32MUW3VTBG

Loading...

Active

CAD Model

Pb

A

H

P

UDFN-8

517DH

1

260

REEL

3000

N

CMOS

32 kb

4k x 8

I2C

400

900

2.5

5.5

-

5

2

-40

125

-

-

$0.22

More Details

Show More

1-25 of 25

Products per page

Jump to :

1
contact sales icon

Support on the go

Find and compare products, get support and connect with onsemi sales team.

Reliability Data

Die Related Summary Data

Device: NV24C32MUW3VTBG

Equivalent to wafer fab process: ONC18

Product Technology

Product Technology

Equivalent Device-Hours

MTBF/MTTF in Hours

FITS

ONC18

2

6465777234

More Details

Re-calculate Data

Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

New Search