Small Signal MOSFETs | NDT3055L

N-Channel Logic Level Enahncement Mode Field Effect Transistor 60V, 4A, 100mΩ

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Overview

These logic level N-Channel enhancement mode power field effect transistors are produced using onsemi's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance and provide superior switching performance, and withstand high energy pulse in the avalanche and commutation modes. These devices are particularly suited for low voltage applications such as DC motor control and DC/DC conversion where fast switching, low in-line power loss, and resistance to transients are needed.

  • This product is general usage and suitable for many different applications.

  • 4 A, 60 V. RDS(ON) = 0.100 Ω @ VGS = 10 V, RDS(ON) = 0.120 Ω @ VGS = 4.5 V.
  • Low drive requirements allowing operation directly from logic drivers. VGS(TH) < 2V.
  • High density cell design for extremely low RDS(ON).
  • High power and current handling capability in a widely used surface mount package.

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Package Name

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Wide SOA Mosfets

Configuration

OPN in older Technology

V(BR)DSS Min (V)

RDS(on) Max @ VGS = 10 V (mΩ)

VGS Max (V)

Vgs(th) Max (V)

Id Max (A)

PD Max (W)

RDS(on) Max @ VGS = 2.5 V (mΩ)

RDS(on) Max @ VGS = 4.5 V (mΩ)

Qg Typ @ VGS = 4.5 V (nC)

Qg Typ @ VGS = 10 V (nC)

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Qgd Typ @ VGS = 4.5 V (nC)

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Reference Price

NDT3055L

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CAD Model

Pb

A

H

P

SOT-223-4 / TO-261-4

318H-01

1

260

REEL

4000

N

N-Channel

PowerTrench® T1

SC-4

Small Signal

Logic

0

NA

0

60

100

±20

2

4

3

-

120

-

13

345

3.2

-

110

30

$0.4045

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Reliability Data

Die Related Summary Data

Device: NDT3055L

Equivalent to wafer fab process: TO

Product Technology

Product Technology

Equivalent Device-Hours

MTBF/MTTF in Hours

FITS

TO

0

955961600

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Re-calculate Data

Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

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