High Voltage MOSFETs | FQD5N50C

Power MOSFET, N-Channel, QFET®, 500 V, 4 A, 1.4 Ω, DPAK

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Overview

These N-Channel enhancement mode power field effect transistors are produced using ON Semiconductor’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switched mode power supplies, active power factor correction, electronic lamp ballasts based on half bridge topology.

  • 4.0A, 500V, RDS(on) = 1.4Ω @VGS = 10 V
  • Low gate charge (typical 18 nC)
  • Low Crss (typical 15 pF)
  • Fast switching
  • 100% avalanche tested
  • Improved dv/dt capability

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Package Type

Case Outline

MSL Type

MSL Temp (°C)

Container Type

Container Qty.

ON Target

Channel Polarity

Silicon Family

Package Name

Type

Gate Level

Wide SOA Mosfets

Configuration

OPN in older Technology

V(BR)DSS Min (V)

RDS(on) Max @ VGS = 10 V (mΩ)

VGS Max (V)

Vgs(th) Max (V)

ID Max (A)

PD Max (W)

RDS(on) Max @ VGS = 2.5 V (mΩ)

RDS(on) Max @ VGS = 4.5 V (mΩ)

Qg Typ @ VGS = 4.5 V (nC)

Qg Typ @ VGS = 10 V (nC)

Ciss Typ (pF)

Qgd Typ @ VGS = 4.5 V (nC)

Qrr Typ (nC)

Coss Typ (pF)

Crss Typ (pF)

Reference Price

FQD5N50CTM-WS

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CAD Model

Pb

A

H

P

DPAK-3 / TO-252-3

369AS

1

260

REEL

2500

N

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PowerTrench® T1

TO-252-3

High Voltage

Standard

0

Single

0

500

1400

±30

4

4

48

-

-

-

18

480

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1900

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Reliability Data

Die Related Summary Data

Device: FQD5N50CTM-WS

Equivalent to wafer fab process: CE

Product Technology

Product Technology

Equivalent Device-Hours

MTBF/MTTF in Hours

FITS

CE

15

2535417142

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Re-calculate Data

Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

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