.SUBCKT FDMS86520L 2 1 3 ****************************************************************** ** Fairchild Discrete Modeling Group ** ****************************************************************** ** Website www.fairchildsemi.com\models ** ****************************************************************** ** (C) Copyright 2009 Fairchild Semiconductor Corporation ** ** All rights reserved ** ** ** ** FDMS86520L Spice model ** ** Revision RevA, October 3 , 2011 ** ****************************************************************** *Nom Temp 25 deg C Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Lgate 1 9 2.775e-9 Ldrain 2 5 0.004e-9 Lsource 3 7 -0.005e-9 RLgate 1 9 27.75 RLdrain 2 5 0.04 RLsource 3 7 -0.05 Rgate 9 6 0.78 * Shielded Gate D_D1 100 5 D_SG_cap D_D2 100 101 D_SG_cap R_R1 101 7 0.62 C_C1 6 101 163e-12 .MODEL D_SG_cap D (IS=1e-9 n=1 RS=5e-3 CJO=1.12e-9 M=0.6 t_abs=25) It 7 17 1 Ebreak 11 7 17 7 66 Rbreak 17 7 RbreakMOD 1 .MODEL RbreakMOD RES (TC1=0.6e-3 TC2=-1e-6) .MODEL DbodyMOD D (IS=6.85e-12 n=1 RS=4.593e-3 TRS1=1.5e-3 TRS2=1e-6 + CJO=1.7e-9 M=0.4 TT=3e-9 XTI=1) .MODEL DbreakMOD D (RS=30e-3 TRS1=1e-3 TRS2=1e-6 ) Rsource 7a 7 1.738e-3 Rdrain 5 16 RdrainMOD 4e-3 .MODEL RdrainMOD RES (TC1=4.3e-3 TC2=9e-6) M_BSIM3 16 6 7a 7a Bsim3 W=3.85 L=0.88e-6 NRS=0 NRD=0 .MODEL Bsim3 NMOS (LEVEL=7 VERSION=3.1 MOBMOD=3 CAPMOD=2 paramchk=1 NQSMOD=0 *Process Parameters + TOX=500e-10 ;Oxide thickness + XJ=0.3e-6 ;Channel depth + NCH=2.3e17 ;Channel concentration *Channel Current + U0=950 VSAT=500000 DROUT=1.2 + DELTA=0.13 PSCBE2=0 RSH=1.738e-3 *Threshold voltage + VTH0=1.3 *Sub-threshold characteristics + VOFF=-0.1 NFACTOR=1.1 *Junction diodes and Capacitance + LINT=0.11e-6 DLC=0.11e-6 + CGSO=380e-12 CGSL=0 CGDO=1e-12 CGDL=170e-12 + CJ=0 CF=0 CKAPPA=0.8 * Temperature parameters + KT1=-1.1 KT2=0 UA1=3e-9 + NJ=10) .ENDS *