.SUBCKT FDMS86201 2 1 3 ****************************************************************** ** Fairchild Discrete Modeling Group ** ****************************************************************** ** Website www.fairchildsemi.com\models ** ****************************************************************** ** (C) Copyright 2009 Fairchild Semiconductor Corporation ** ** All rights reserved ** ** ** ** FDMS86201 Spice model ** ** Revision RevB, 27 Jan 2011 ** ****************************************************************** *Nom Temp 25 deg C Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Lgate 1 9 1.924e-9 Ldrain 2 5 0.004e-9 Lsource 3 7 0.326e-9 RLgate 1 9 19.24 RLdrain 2 5 0.04 RLsource 3 7 3.26 Rgate 9 6 0.5 * Shielded Gate D_D1 100 5 D_SG_cap D_D2 100 101 D_SG_cap R_R1 101 7 1.01 C_C1 6 101 185e-12 .MODEL D_SG_cap D (IS=1e-9 n=1 RS=4e-3 CJO=2.7e-9 M=0.62 t_abs=25) It 7 17 1 Ebreak 11 7 17 7 126.85; 110 Rbreak 17 7 RbreakMOD 1 .MODEL RbreakMOD RES (TC1=0.8e-3 TC2=-0.4e-6) .MODEL DbodyMOD D (IS=10e-12 n=1 RS=3.65e-3 TRS1=2.6e-3 TRS2=1e-6 + CJO=0.66e-9 M=0.47 TT=0.1e-9 XTI=2.5) .MODEL DbreakMOD D (RS=30e-3 TRS1=1e-3 TRS2=1e-6 ) Rsource 7a 7 0.359e-3 Rdrain 5 16 RdrainMOD 6.9e-3 .MODEL RdrainMOD RES (TC1=7.20e-3 TC2=20e-6) M_BSIM3 16 6 7a 7a Bsim3 W=5.12 L=1.2e-6 NRS=0 NRD=0 .MODEL Bsim3 NMOS (LEVEL=7 VERSION=3.1 MOBMOD=3 CAPMOD=2 paramchk=1 NQSMOD=0 *Process Parameters + TOX=1000e-10 ;Oxide thickness + XJ=0.5e-6 ;Channel depth + NCH=0.8e17 ;Channel concentration *Channel Current + U0=640 VSAT=500000 DROUT=1.8 + DELTA=0.02 PSCBE2=0.00001 RSH=0.359e-3 *Threshold voltage + VTH0=2.95 *Sub-threshold characteristics + VOFF=-0.15 NFACTOR=1.1 *Junction diodes and Capacitance + LINT=0.22e-6 DLC=0.24e-6 + CGSO=144e-12 CGSL=0 CGDO=7e-12 CGDL=125e-12 + CJ=0 CF=0 CKAPPA=0.25 * Temperature parameters + KT1=-1.8 KT2=0 UA1=6e-9 + NJ=10) .ENDS