.SUBCKT FDC8601 2 1 3 ****************************************************************** ** Fairchild Discrete Modeling Group ** ****************************************************************** ** Website www.fairchildsemi.com\models ** ****************************************************************** ** (C) Copyright 2009 Fairchild Semiconductor Corporation ** ** All rights reserved ** ** ** ** FDC8601 Spice model ** ** Revision RevA, 15 Dec 2010 ** ****************************************************************** *Nom Temp 25 deg C Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Lgate 1 9 0.399e-9 Ldrain 2 5 0.1e-9 Lsource 3 7 0.009e-9 RLgate 1 9 3.99 RLdrain 2 5 1 RLsource 3 7 0.09 Rgate 9 6 0.6 *Shielded Gate D_D1 100 5 D_SG_cap D_D2 100 101 D_SG_cap R_R1 101 7 1.456 C_C1 6 101 25e-12 .MODEL D_SG_cap D (IS=1e-9 n=1 RS=4e-3 CJO=0.22e-9 M=0.52 t_abs=25) It 7 17 1 Ebreak 11 7 17 7 109.6 Rbreak 17 7 RbreakMOD 1 .MODEL RbreakMOD RES (TC1=0.67e-3 TC2=-0.3e-6) .MODEL DbodyMOD D (IS=1.0e-12 n=1.05 RS=26.0e-3 TRS1=2.5e-3 TRS2=1e-6 + CJO=0.06e-9 M=0.38 TT=1e-9 XTI=2.75) .MODEL DbreakMOD D (RS=8e-3 TRS1=1e-3 TRS2=1e-6 ) Rsource 7a 7 11.913e-3 Rdrain 5 16 RdrainMOD 52e-3 .MODEL RdrainMOD RES (TC1=7.5e-3 TC2=22e-6) M_BSIM3 16 6 7a 7a Bsim3 W=0.371963371428571 L=1.15e-6 NRS=0 NRD=0 .MODEL Bsim3 NMOS (LEVEL=7 VERSION=3.1 MOBMOD=3 CAPMOD=2 paramchk=1 NQSMOD=0 *Process Parameters + TOX=1000e-10 ;Oxide thickness + XJ=0.62e-6 ;Channel depth + NCH=1.2e17 ;Channel concentration *Channel Current + U0=825 VSAT=500000 DROUT=1.8 + DELTA=0.4 PSCBE2=0 RSH=11.913e-3 *Threshold voltage + VTH0=3.25 *Sub-threshold characteristics + VOFF=-0.09 NFACTOR=1.9 *Junction diodes and Capacitance + LINT=0.175e-6 DLC=0.225e-6 + CGSO=220e-12 CGSL=0 CGDO=1e-12 CGDL=195e-12 + CJ=0 CF=0 CKAPPA=1 * Temperature parameters + KT1=-2.2 KT2=0 UA1=6.2e-9 + NJ=10) .ENDS