NCP170AMX180GEVB: Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board

The NCP170AMX180GEVB evaluation board is designed to quickly test the NCP170, a series of CMOS low dropout regulators are designed specifically for portable battery-powered applications which require ultra-low quiescent current. The ultra-low consumption of type 500nA ensures long battery life and dynamic transient boost feature improves device transient response for wireless communication applications.
Evaluation/Development Tool Information
Product Status Compliance Short Description Parts Used Action
NCP170AMX180GEVB Active
Pb-free
Ultra Low IQ 150mA CMOS LDO Regulator Evaluation Board NCP170BMX180TCG
Technical Documents
Type Document Title Document ID/Size Rev
Eval Board: BOM NCP170AMX180GEVB Bill of Materials ROHS Compliant NCP170AMX180GEVB_BOM_ROHS.pdf - 15 KB  0 
Eval Board: Gerber NCP170AMX180GEVB Gerber Layout Files (Zip Format) NCP170AMX180GEVB_GERBER.zip - 36 KB  0 
Eval Board: Schematic NCP170AMX180GEVB Schematic NCP170AMX180GEVB_SCHEMATIC.pdf - 50 KB  0 
Eval Board: Test Procedure NCP170AMX180GEVB Test Procedure NCP170AMX180GEVB_TEST_PROCEDURE.pdf - 36 KB  0 
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Ultra‐Low IQ 150 mA CMOS LDO Regulator Evaluation Boards - NCP170
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