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What is the lifetime, MTBF, or FIT (failure in time) of a BJT operated at its maximum rated junction temperature? I am assuming that a rating of 150C has some such lifetime, MTBF, or FIT factor. Is this factor an industry standard value for any given junction temperature that I can use with the Arrhenius Equation to estimate the increase in lifetime, MTBF, or corresponding reduction in FIT? What standard might specify and have more details of this issue? Please send me the links to any On Semiconductor documents that might have more details as well. Thank you, Larry

ON Semiconductor performs extensive reliability stress testing on devices that span the full breadth of our product portfolio. Reliability data is collected as part of the ON Semiconductor Reliability Audit Program, and as part of the normal product qualification and re-qualification process.

Please refer to our reliability data summary and reliability data online FIT and MTBF/MTTF calculator.
Answered by:
ON Semiconductor
2013-04-25 14:41:21.444